Product Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-258-3142 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part Alternates: 242, 6625-01-258-3142, 01-258-3142, 6625012583142, 012583142
Instruments and Laboratory Equipment | Electrical and Electronic Properties Measuring and Testing Instruments
| Supply Group (FSG) | NSN Assign. | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | 01-258-3142 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
Drawings & Photos | NSN 6625-01-258-3142
Demand History | NSN 6625-01-258-3142
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Related Products | NSN 6625-01-258-3142
6625-01-258-3532, 6625-01-258-3887, 6625-01-258-3888, 6625-01-258-3889, 6625-01-258-4094
Restrictions/Controls & Freight Information | NSN 6625-01-258-3142
| Category | Code | Description |
|---|---|---|
| Hazardous Material Indicator Code | P | There is no information in the HMIS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product |
| Category | Code | Description |
|---|---|---|
| No Freight Information | ||