Product Details | DIGITAL-LINEAR MICROCIRCUIT

5962-01-114-3301 A microcircuit having the dual functions of a MICROCIRCUIT (1), DIGITAL and a MICROCIRCUIT (1), LINEAR.

Part Alternates: CD4051BF/3, CD4051BF3, HL110049, F4051BDMQB, 8394220014, 839422-0014, 14051BBEBS, 5962-01-114-3301, 01-114-3301, 5962011143301, 011143301

Electrical and Electronic Equipment Components | Microcircuits, Electronic

Supply Group (FSG) NSN Assign. NIIN
59 16 JUN 1981 01-114-3301

Cross Reference | NSN 5962-01-114-3301

Part Number Cage Code Manufacturer
14051BBEBS 04713 FREESCALE SEMICONDUCTOR, INC.
839422-0014 06481 NORTHROP GRUMMAN SYSTEMS CORPORATION
839422-0014 13973 LITTON SYSTEMS INC. DIV NAVIGATION SYSTEMS DIVISION
CD4051BF/3 34371 INTERSIL CORPORATION
F4051BDMQB 07263 FAIRCHILD SEMICONDUCTOR CORP
HL110049 07263 FAIRCHILD SEMICONDUCTOR CORP

Request a Quote

What Our Customers Say

Compare

NSNs for Compare ( up to 4 ): Add 5962-01-114-3301

Technical Data | NSN 5962-01-114-3301

Characteristic Specifications
OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
DESIGN FUNCTION AND QUANTITY 1 MULTIPLEXER/DEMULTIPLEXER, ANALOG
INPUT CIRCUIT PATTERN 8 CHANNEL
VOLTAGE RATING AND TYPE PER CHARACTERISTIC 15.0 VOLTS MAXIMUM TOTAL SUPPLY
TIME RATING PER CHACTERISTIC 90.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 90.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
OPERATING TEMP RANGE -55.0 TO 125.0 DEG CELSIUS
TERMINAL TYPE AND QUANTITY 16 PRINTED CIRCUIT
TERMINAL SURFACE TREATMENT TIN
INCLOSURE CONFIGURATION DUAL-IN-LINE
INCLOSURE MATERIAL CERAMIC
CASE OUTLINE SOURCE AND DESIGNATOR D-2 MIL-M-38510
BODY LENGTH 0.840 INCHES MAXIMUM
BODY HEIGHT 0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM
BODY WIDTH 0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM
MAXIMUM POWER DISSIPATION RATING 500.0 MILLIWATTS
STORAGE TEMP RANGE -65.0 TO 150.0 DEG CELSIUS
FEATURES PROVIDED MONOLITHIC AND W/INHIBIT AND ELECTROSTATIC SENSITIVE
TEST DATA DOCUMENT 13973-839422 SPECIFICATION

Restrictions/Controls & Freight Information | NSN 5962-01-114-3301

Category Code Description
Hazardous Material Indicator CodeNThere is no data in the HMIS and the NSN is in an FSC not generally suspected of containing hazardous materials
Demilitarization Code:QStrategic List Item (SLI). Demilitarization not required. SLI are non-MLI(Munitions List Items) controlled by the U.S. Dept. of Commerce through the Export Administration Regulations (EAR) and indicated on the Commerce Control List (CCL). Each CCL entry is preceded by a four-digit Export Control Commerce Control List Item (CCLI) – MUT to the point of scrap required outside the United States. Inside the United States, MUT is required when the DEMIL integrity code (IC) is “3” and MUT is not required when the DEMIL IC is “6.”
Electro-static Discharge Susceptible:BESD sensitivity
Precious Metals Indicator Code:AItem does not contain precious metal
Criticality Code:X The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Automatic Data Processing Equipment:0Represents items with no ADP components. NOTE: Codes 1 through 6 are only to be used when the item is Automatic Data Processing Equipment (ADPE) in its entirety and is limited to the type meeting only one of the definitions for codes 1 through 6. (See code 9)
Category Code Description
NMF Description 061700 ELEC APPLIANCES/INSTRUMENTS NOI
Less than car load rating
Less than truck load rating W Rating Variable
Water commodity Code 72D unknown
Originating Activity Code TX Defense Supply Center Columbus
Columbus, OH 43218
Air Dimension Code A Shipment is not a consolidation and does not exceed 72 inches in any dimension.
Air Commodity H Signal Corps supplies and equipment, including radio equipment and supplies, communications equipment and supplies, electrical equipment and supplies, etc.
Air Special Handling Z No special handling required.
Special Handling Code 9 unknonwn
HAZMAT
Type of Cargo 3 Electrostatic Sensitive Device (ESD), subject to damage caused by electrostatic discharge. (See DoD 4500.32-R, Volume 1, Appendix A, Section I for additional information on ESD devices).