NSN 5962-01-158-1049 N74LS32N/B, N74LS32NB, SN74LS32N3
Product Details | DIGITAL MICROCIRCUIT
5962-01-158-1049 A microcircuit specifically designed to generate, modify, or process electrical signals which operate with two distinct or binary states. These states are commonly referred to as on and off, true and false, high and low, or "1" and "0".
Part Alternates: N74LS32N/B, N74LS32NB, SN74LS32N3, SN74LS32NDS, DM74LS32NA, 74LS32PCQR, 1004389-01, 5962-01-158-1049, 01-158-1049, 5962011581049, 100438901, 011581049
Electrical and Electronic Equipment Components | Microcircuits, Electronic
| Supply Group (FSG) | NSN Assign. | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 59 | 18 JUL 1983 | 01-158-1049 | 31779 ( MICROCIRCUIT, DIGITAL ) |
Cross Reference | NSN 5962-01-158-1049
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 1004389-01 | 1PQF4 | L-3 COMMUNICATIONS CORPORATION DBA LINK SIMULATION & TRAINING |
| 1004389-01 | 36378 | RAYTHEON TECHNICAL SERVICES COMPANY |
| 74LS32PCQR | 07263 | FAIRCHILD SEMICONDUCTOR CORP |
| DM74LS32N/A+ | 12040 | NATIONAL SEMICONDUCTOR CORP |
| N74LS32N/B | 18324 | PHILIPS SEMICONDUCTORS INC |
| SN74LS32N3 | 01295 | TEXAS INSTRUMENTS INCORPORATED DBA TEXAS INSTRUMENTS |
| SN74LS32NDS | 04713 | FREESCALE SEMICONDUCTOR, INC. |
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Technical Data | NSN 5962-01-158-1049
| Characteristic | Specifications |
|---|---|
| OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| DESIGN FUNCTION AND QUANTITY | 4 GATE, OR |
| INPUT CIRCUIT PATTERN | QUAD 2 INPUT |
| TIME RATING PER CHACTERISTIC | 22.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 22.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| OPERATING TEMP RANGE | -0.0 TO 70.0 DEG CELSIUS |
| INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| INCLOSURE MATERIAL | PLASTIC |
| BODY LENGTH | 0.785 INCHES MAXIMUM |
| BODY HEIGHT | 0.180 INCHES MAXIMUM |
| BODY WIDTH | 0.250 INCHES NOMINAL |
| STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| FEATURES PROVIDED | SCHOTTKY AND LOW POWER AND W/TOTEM POLE OUTPUT AND POSITIVE OUTPUTS |
| III UNPACKAGED UNIT WEIGHT | 0.9 GRAMS |
Restrictions/Controls & Freight Information | NSN 5962-01-158-1049
| Category | Code | Description |
|---|---|---|
| Hazardous Material Indicator Code | N | There is no data in the HMIS and the NSN is in an FSC not generally suspected of containing hazardous materials |
| Demilitarization Code: | B | Munitions List Item - Mutilation (MUT) to the point of scrap required. (Formerly: Demilitarization not required. Trade Security Controls (TSCs) required at disposition.) |
| Electro-static Discharge Susceptible: | B | ESD sensitivity |
| Precious Metals Indicator Code: | A | Item does not contain precious metal |
| Criticality Code: | X | The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. |
| Automatic Data Processing Equipment: | 0 | Represents items with no ADP components. NOTE: Codes 1 through 6 are only to be used when the item is Automatic Data Processing Equipment (ADPE) in its entirety and is limited to the type meeting only one of the definitions for codes 1 through 6. (See code 9) |
| Category | Code | Description |
|---|---|---|
| NMF Description | 061700 | ELEC APPLIANCES/INSTRUMENTS NOI |
| Less than car load rating | ||
| Less than truck load rating | W | Rating Variable |
| Water commodity Code | 658 | unknown |
| Originating Activity Code | TX | Defense Supply Center Columbus Columbus, OH 43218 |
| Air Dimension Code | A | Shipment is not a consolidation and does not exceed 72 inches in any dimension. |
| Air Commodity | H | Signal Corps supplies and equipment, including radio equipment and supplies, communications equipment and supplies, electrical equipment and supplies, etc. |
| Air Special Handling | Y | Protected cargo, other than above, including sensitive cargo requiring hand-to-hand receipt and/or security precautions. |
| Special Handling Code | 5 | unknonwn |
| HAZMAT | ||
| Type of Cargo | 3 | Electrostatic Sensitive Device (ESD), subject to damage caused by electrostatic discharge. (See DoD 4500.32-R, Volume 1, Appendix A, Section I for additional information on ESD devices). |



