NSN 6625-01-397-0782 108736, 01-397-0782, 013970782
Product Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-397-0782 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part Alternates: 108736, 6625-01-397-0782, 01-397-0782, 6625013970782, 013970782
Instruments and Laboratory Equipment | Electrical and Electronic Properties Measuring and Testing Instruments
| Supply Group (FSG) | NSN Assign. | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | 01-397-0782 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
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Technical Data | NSN 6625-01-397-0782
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | RF TRANSISTOR TESTS |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| III END ITEM IDENTIFICATION | AN/FRN-43/45 |
| III SUPPLEMENTARY FEATURES | TESTS TRANSISTORS USED IN P/N 107296; 105400;AND 7 SUB-TESTS SETS TO TEST; 1W OSCILLATOR FROM GHZ, RFP & PHILIPS; 1W AMPLIFIER FROM MOTOROLA, GHZ, RFP, & THOMSON; 7W AMPLIFIER FOR GHZ &RFP; 7W AMPLIFIER FROM THOMSON; 50W AMPLIFIER FROM GHZ & RFP; 50W AMPLIFIER FROM PHILIPS; 50W AMPLIFIER FROM THOMSON |
| MANUFACTURERS CODE | 20284 |
| DESIGN CONTROL REFERENCE | 108736 |
Restrictions/Controls & Freight Information | NSN 6625-01-397-0782
| Category | Code | Description |
|---|---|---|
| Hazardous Material Indicator Code | P | There is no information in the HMIS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product |
| Electro-static Discharge Susceptible: | A | No known Electrostatic Discharge (ESD) or Electromagnetic Interference (EMI) sensitivity |
| Category | Code | Description |
|---|---|---|
| No Freight Information | ||