Product Details | SEMICONDUCTOR DEVICE TEST SET

6625-01-418-2918 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part Alternates: 108418, 6625-01-418-2918, 01-418-2918, 6625014182918, 014182918

Instruments and Laboratory Equipment | Electrical and Electronic Properties Measuring and Testing Instruments

Supply Group (FSG) NSN Assign. NIIN
66 01-418-2918

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Technical Data | NSN 6625-01-418-2918

Characteristic Specifications
TEST TYPE FOR WHICH DESIGNED TRANSISTOR TESTING
OPERATING TEST CAPABILITY 250 WATTS
INCLOSURE FEATURE MULTIPLE ITEM W/CARRYING CASE
MAJOR COMPONENTS TEST FIXTURE CHASSIS P/N 512683, RF TRANSISTOR TEST FIXTURE 109139G2, WHICH DOES NOT FUNCTION AS A STAND ALONE, BINDING POSTS-2, LARGE TRANSISTOR BOX-1, SMALL TRANSISTOR BOXES-5, TOTE BOX AND COVER-1 EACH; FIXED RESISTOR RE80G49R9; SWITCH 415167; LUG TERMINALS-5; SILICON DIODE-1; CONNECTORS-4
III END ITEM IDENTIFICATION TRANSISTOR 407257, 5961-01-290-7253; AN/FRN-43 & AB/FRN-45 5825-01-347-6976
MANUFACTURERS CODE 20284
DESIGN CONTROL REFERENCE 108418

Restrictions/Controls & Freight Information | NSN 6625-01-418-2918

Category Code Description
Hazardous Material Indicator CodePThere is no information in the HMIS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product
Category Code Description
No Freight Information